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The microstructure of the EEG-based products was investigated by X-ray diffraction and Raman spectroscopy. The XRD patterns in Figure 3c reveal that the EG sample exhibits two characteristic peaks, a broad band at ∼ 11.4o (d- spacing: 0.78 nm) which is ascribable to the interlayer separation due to the oxygen functional groups attached to the graphene sheets[13] and a well-defined peak at around 26.1o (d002-spacing: 0.34 nm), at a position identical to that of raw graphite, which suggests that the EG sample still contains a certain number of graphite-like particles. By contrast, the film obtained by filtration of the OG dispersion exhibits a much smaller peak at 23.7o, with a lattice spacing of ~0.38 nm, which suggests the presence of oxygen functional groups between the graphene layers. The low intensity of this peak indicates that the OG layers will not restack back to graphite when they form a compressed film, but will give rise to a disordered structure typical of graphene-based films.[14] Further evidence of the structural characteristics and defects of the products derived from the EGG process was obtained by means of Raman spectroscopy. Figure 3d shows the first-order region (1000-2000 cm-1) of the Raman spectra of the raw graphite and the products derived from the EGG process. The spectra exhibit three characteristic peaks, which can be associated to two characteristic structural properties. Thus, the D band at ∼ 1350 cm-1 and the D ́ shoulder at ∼ 1620 cm-1 reflect the presence of defects and structural disorder in the sp2 carbon network. On the other hand, the so called graphitic G band at ∼ 1590 cm-1 corresponds to the in-plane vibrations of the graphene lattice and it is the only peak in defect- free graphite/graphene materials. In order to evaluate the degree of defects, we used the integrated intensity ratio of the D and G bands (ID/IG ratio), whose values are included in Figure 3d. As might be expected, the raw graphite has a 9PDF Image | Graphene from Electrochemically Exfoliated Graphite
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