Synthesis and Fabrication of Graphene and Graphene Oxide

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Synthesis and Fabrication of Graphene and Graphene Oxide ( synthesis-and-fabrication-graphene-and-graphene-oxide )

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3.1. Optical Microscopy Optical microscopy technique is an easy, straightforward, and effective method for non-destructive characterization of graphene. It is primarily used to deter- mine the number of layers in graphene by using the contrast difference between graphene layers and the substrate. Size and shape of the graphene structure is also obtained from this technique. Figure 14(a) shows the optical micrograph with different graphene layers of graphene on SiO2/Si substrate [99]. 3.2. Scanning Probe Microscopy Scanning probe microscopy (SPM) is a popular technique used to characterize the topography of nanomaterials such as graphene by scanning the sample with a probe. Two SPM commonly used techniques for graphene characterization are atomic force microscopy (AFM) and scanning tunneling microscopy (STM). In the AFM mode, scanning is done in either the contact or noncontact tapping mode of the probe tip with the deflection of the cantilever probe based on the topography of the graphene structure to form 2D and 3D images. Figure 14(b) shows the AFM image of mechanically exfoliated graphene flake with atom- ic-level thickness [100]. STM utilizes tunneling current between the SPM probe and graphene to form similar pattern of the topography of the sample. Figure 14(c) shows high contrast atomic resolution of obtained using STM for gra- phene hexagonal structure [101]. Figure 14. (a) Optical micrograph showing single-(1L), bi-(2L), and trilayer (3L) graphene on SiO2/Si substrate [99]; (b) AFM image of mechanically exfoliated graphene (Scale bar is 1 μm) [100]; (c) STM micrograph showing atomic resolution of graphene with hexagonal close-packed lattice structure [101]; (d) SEM micrograph showing exfoliated graphene layers [102]; (e) The hexagonal honeycomb lattice of SLG under HRTEM (Scale bar is 0.2 nm) [103]; (f) Raman spectra of one to four layers of graphene on SiO2/Si substrate [104]. A. Adetayo, D. Runsewe DOI: 10.4236/ojcm.2019.92012 221 Open Journal of Composite Materials

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