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LIST OF FIGURES 2.11SchematicviewofAFMset-up.................... 54 2.12 Schematic view of local conductivity AFM measurements . . . .. 55 2.13 Transitions in vibrational spectroscopy . . . . . . . . . . . . . .. 57 3.1 Scheme of Radio Frequency magnetron sputtering experiment .. 60 3.2 Comparison of macroscopic optical images of sample S-12AOw sur- face before and after annealing. The streak in the surface before annealing is an artefact, the colour and resolution are blurred by thesampleplasticpackaging. .................... 64 3.3 Surfaceafterannealing........................ 65 3.4 SurfaceimagesofS-42Anfilm .................... 66 3.5 Macroscopic elemental distribution and thickness of S-12AOw thin film................................... 67 3.6 Macroscopic elemental distribution and thickness of S-24AOw thin film................................... 68 3.7 Macroscopic elemental distribution and thickness of S-30AOn thin film................................... 69 3.8 Miscroscopic image of S-42Aw film after damage under high vac- uumconditions ............................ 70 3.9 Macroscopic elemental distribution and thickness of S-42Aw thin film................................... 70 3.10GrowthspeedofSmNiO3thinfilms................. 71 3.11 Sm/NiatomicratioinSmNiO3thinfilms....... 3.12 Surface distribution of elements in sample S-12AOw. 3.13 Spatial distribution of elements in sample S-12AOw. . 3.14 Survey spectra of sample before (red) and after (blue) annealing of S-42Aw and S-42An deposited in pure argon atmosphere . . . . 75 3.15 Chromium2pXPSenvelopeinsampleS-42Aw. . . . . . . . . . . 76 3.16X-raydiffractionpatternsofSmNiO3 ................ 77 3.17 X-ray diffraction patterns of SmNiO3 thin films deposited in argon plasmaandannealed.......................... 78 3.18 X-ray diffraction patterns of SmNiO3 thin films deposited in argon- oxygenplasmaandannealed. .................... 79 3.19110PolefigureofS-36AOw ..................... 80 3.20220PolefigureofS-36AOw ..................... 81 3.21PolefigureofS-36AOw........................ 82 3.22 Rietveld refinement of S-36AOw diffraction pattern. . . . . . . . . 83 xiv ....... 72 ....... 73 ....... 74PDF Image | Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films
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