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LIST OF FIGURES 3.23 AFM image of surface topography of S-30AOn film, 3×3 μm2 scan. 84 3.24 AFM image of surface topography of S-30AOn film, 500×500 nm2 scan................................... 85 3.25 AFM image of surface topography of S-36AOw film. . . . . . . . . 85 4.1 Selected local current maps in sample S-30AOn obtained in various temperatures.Scansize-2×2μm2.................. 90 4.2 Average current as a function of temperature in sample before and afterannealing ............................ 91 4.3 Phenomena during local current mapping in sample S-36AOw. . . 92 4.4 ResistiveswitchinginS-30AOwat453K. . . . . . . . . . . . . . 93 4.5 Average resistance versus temperature in sample S-30AOw. . . . . 94 4.6 Average current and resistance as a function of temperature in sampleS-36AOw............................ 95 4.7 Local conductivity in certain regions of sample S-36AOw surface. 96 4.8 Average current and resistance versus temperature in sample S- 12AOw. ................................ 97 4.9 Local conductivity in certain regions of sample S-12AOw surface. 97 4.10 Temperature dependence of averaged I-V characteristics in sample S-24AOw. ............................... 98 4.11 Temperature dependence of I-V characteristics of individual points insampleS-24AOw. ......................... 100 4.12 Temperature dependence of chosen Raman mode in sample S-42Aw 103 4.13 Temperature dependence of chosen Raman mode in sample S-36AOw104 4.14 Temperature dependence of Raman modes in sample S-12AOw . . 105 4.15 Temperature dependence of chosen Raman mode in sample S-12AOw106 4.16 Temperature dependence of Raman spectra in sample S-30AOn . 107 4.17 Nickel 2p multiplet spectra at different temperatures for sample S-36AOw ............................... 110 4.18 Temperature dependent nickel 2p multiplet spectra with fitting for sampleS-12AOw ........................... 111 4.19 Temperature dependence of nickel 2p multiplet spectra for sample S-42Aw ................................ 113 4.20 Nickel 2p multiplet spectrum fitting at for sample S-30AOn . . . . 114 xvPDF Image | Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films
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