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Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films

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Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films ( investigation-metal-insulator-transition-magnetron-sputtered )

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2. EXPERIMENTAL METHODS 2.2 X-ray Fluorescence Spectroscopy X-ray Fluorescence Spectroscopy (XRF) is a fast and informative technique to analyse the chemical composition of an unknown material. The core phenomena underlying the measurement technique is the fluorescence of atoms of a sample, induced by irradiation with intense X-ray radiation of wide range of wavelengths. The electrons in sample are excited to higher energy level which is a photoelec- tric effect. The relaxation of the atom is done by relaxation of electrons to lower energy levels with simultaneous emission of X-ray radiation. The emitted set of wavelengths is corresponding to the structure of electronic levels in an atom and thus is characteristic of the chemical composition of material. Once the radiation is absorbed it can further interact with the sample’s matter and become attenu- ated or amplified. Reliable quantification of elemental content requires to have a numerical determinant of the strength of those phenomena. This is well realized by application of mass absorption coefficient. Figure 2.4: Scheme of generation of fluorescent radiation - A core level electron is excited by absorbed X-ray or gamma photon. Photoelectric ionization can be followed by either radiative relaxation, causing the emission of characteris- tic fluorescent X-rays or non-radiative relaxation, involving the emission of Auger electrons. As presented in (31), p.370. 40

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Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films

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