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BIBLIOGRAPHY lution of RNiO3 (R=Ho,Y,Er,Lu) perovskites: Charge disproportionation and electronic localization. Phys. Rev. B, 64, 094102. 6 [9] Aydogdu, G.H., Ha, S.D., Viswanath, B. & Ramanathan, S. (2011). Epitaxy, strain, and composition effects on metal-insulator transition characteristics of SmNiO3 thin films. Journal of Applied Physics, 109, 124110. 48, 60, 61 [10] Biesinger, M.C., Brown, C., Mycroft, J.R., Davidson, R.D. & McIntyre, N.S. (2004). X-ray photoelectron spectroscopy studies of chromium compounds. Surface and Interface Analysis, 36, 1550–1563. 73 [11] Biesinger, M.C., Payne, B.P., Lau, L.W.M., Gerson, A. & Smart, R.S.C. (2009). X-ray photoelectron spectroscopic chemical state quantification of mixed nickel metal, oxide and hydroxide systems. Surface and Interface Analysis, 41, 324–332. 50, 51 [12] Bilewska, K., Wolna, E., Edely, M., Ruello, P. & Szade, J. (2010). Evidence of charge disproportionation on the nickel sublattice in EuNiO3 thin films: X-ray photoe- mission studies. Phys. Rev. B, 82, 165105. 106 [13] Catalan, G. (2008). Progress in perovskite nickelate research. Phase Transitions, 81, 729–749. 59 [14] Catalan, G., Bowman, R.M. & Gregg, J.M. (2000). Metal-insulator transitions in NdNIO3 thin films. Phys. Rev. B, 62, 7892–7900. 23 [15] Catalan, G., Bowman, R.M. & Gregg, J.M. (2000). Transport properties of NDNIO3 thin films made by pulsed-laser deposition. Journal of Applied Physics, 87, 606–608. 59 [16] Chen, H.L., Lu, Y.M., Wu, J.Y. & Hwang, W.S. (2005). Effects of Substrate Tem- perature and Oxygen Pressure on Crystallographic Orientations of Sputtered Nickel Oxide Films. Materials Transactions, 46, 2530–2535. 82 [17] Conchon, F., Boulle, A., Girardot, C., Pignard, S., Guinebretie`re, R., Dooryhe ́e, E., Hodeau, J.L., Weiss, F., Kreisel, J. & Be ́rar, J.F. (2007). Epi- taxial stabilization of SmNiO3 films on (0 0 1) SrTiO3 substrates. Journal of Physics D: Applied Physics, 40, 4872–4876. 60 [18] Counsell, J.D.P., Roberts, A.J., Boxford, W., Moffitt, C. & Takahashi, K. (2014). Reduced Preferential Sputtering of TiO2 using Massive Argon Clusters. Journal of Surface Analysis, 20, 211–215. 49 [19] Cullity, B.D. (1978). Elements of X-Ray Diffraction. Addison-Wesley Publishing Com- pany, Inc., Nˆotre Dame, Indiana. 36 124PDF Image | Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films
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