Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films

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BIBLIOGRAPHY [80] Montero, J., Guille ́n, C., Granqvist, C.G., Herrero, J. & Niklasson, G.A. (2014). Preferential Orientation and Surface Oxidation Control in Reactively Sputter Deposited Nanocrystalline SnO2:Sb Films: Electrochemical and Optical Results. ECS Journal of Solid State Science and Technology, 3, N151–N153. 82 [81] Necˇas, D. & Klapetek, P. (2012). Gwyddion: an open-source software for SPM data analysis. Central European Journal of Physics, 10, 181–188. 55 [82] Obradors, X., Paulius, L., Maple, M., Torrance, J.B., Nazzal, A.I., Fontcu- berta, J. & Granados, X. (1993). Pressure dependence of the metal-insulator transi- tion in the charge-transfer oxides RNiO3 (R= Pr, Nd, Nd0.7La0.3). Physical Review B, 47, 12353–12356. 8, 9 [83] Ohring, M. (2002). The Materials Science of Thin Films, chap. Characterization of Thin Films, 273–275. Academic Press, San Diego. 38 [84] O’Keeffe, M. & Hyde, B.G. (1977). Some structures topologically related to cubic perovskite (E21), ReO3 (D09) and Cu3Au (L12). Acta Crystallographica Section B, 33, 3802–3813. 9 [85] Quiro ́s, M., Graˇzulis, S., Girdzijauskaite ̇, S., Merkys, A. & Vaitkus, A. (2018). Using SMILES strings for the description of chemical connectivity in the Crystallography Open Database. Journal of Cheminformatics, 10. 38 [86] Rodriguez-Carvajal, J. (2006). Fullprof Suite. Crystallographic tools for Rietveld, profile matching & integrated intensity refinements of X-ray and/or neutron data. https: //www.ill.eu/sites/fullprof/index.html. 38 [87] Sato, S., Takahashi, R., Kobune, M. & Gotoh, H. (2009). Basic properties of rare earth oxides. Applied Catalysis A: General, 356, 57 – 63. 3 [88] Shi, J., Ha, S.D., Zhou, Y., Schoofs, F. & Ramanathan, S. (2013). A correlated nickelate synaptic transistor. Nature Communications, 4:2676, 1–9. 2 [89] Suwas, S. & Ray, R.K. (2014). Crystallographic Texture of Materials. Engineering Materials and Processes.. Springer-Verlag, London. 81 [90] Suzuki, S., Sugiyama, K. & Waseda, Y. (2002). Changes in the chemical state and composition of the surface of iron oxides due to argon ion sputtering. Journal of Surface Analysis, 9, 455–458. 49 [91] Tiwari, A. & Rajeev, K. (1998). Effect of oxygen stoichiometry on the electrical re- sistivity behaviour of NdNiO3−δ . Solid State Communications, 109, 119 – 124. xvii, 11, 12, 19, 25, 29 130

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