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Figure 5.15: FE-SEM top-down (top) and cross sectional (bottom) of 100 vol. % ZnEO PRESS control sample. A dense film is observed. XRD, Figure 5.16, indicates that the film consists of polycrystalline zincite (ZnO) and ZnO2. XPS is used to determine the composition of the film. XPS, Figure 5.17, indicates an atomic ratio of Zn:O::1:1 at the surface and a different atomic ratio of Zn:O::2:3, with no carbon contamination, in the bulk of the film. 162PDF Image | Supercritical Fluid Deposition Of Thin Metal Films
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