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VAPOR PHASE TREATMENT OF DELECTRIC MATERALS

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VAPOR PHASE TREATMENT OF DELECTRIC MATERALS ( vapor-phase-treatment-delectric-materals )

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orsolventmixturemaycompriseacombinationofanyofthe Solventsmentionedherein.Insomeembodiments,thesolvent compriseswater,ethanol,propanol,acetone,ethyleneoxide, benzene,toluene,ethers,cyclohexanone,butyrolactone,45 methylethylketone,andanisole. asdepositionofcapfilmbyPECVDtechniques,andviaand trenchformationbypaterningbymeansofetchingandash ing,atomiclayerdeposition,physicalvapordeposition,anda chemicalvapordepositiontreatmenttendtoremovecarbon containingmoietieswhicharehydrophobicgroupsfromthe organosilicateglasdielectricfilmsandreplacethemwith silanolgroups.Undesirablepropertiesresultwhentheorga nosilicateglasdielectricfilmscontainsilanolgroups.Sil anols,andthewaterthattheycanadsorbfromtheairare highlypolarizableinanelectricfield,andthuswilraisethe dielectricconstantofthefilm,andwilllowerresistancetowet cleaningchemistriesandincreaseVolatileevolution.Also, whenthetrenchesandviasarefilledwithametalandsub US 7,678,712B2 10 “non-polarmeansthatcharacteristicofamoleculeorcom includeSubjectingthefilmtoradiantenergy,e.g.,ultraviolet, poundthatcreatesanequalcharge,partialchargeorsponta electronbeam,microwaveenergy,andthelike. neouschargedistributionatonepointoforalongthemol U.S.Pat.Nos.6,204.202and6,413,882,incorporatedby eculeorcompound.Insomecontemplatedembodiments,the Solventorsolventmixture(comprisingatleasttwosolvents) referenceherein,providesilicon-basedprecursorcomposi tionsandmethodsforformingnanoporoussilicadielectric filmsbydegradingorvaporizingoneormorepolymersor oligomerspresentintheprecursorcomposition.U.S.Pat.No. 6,495,479,providessilicon-basedprecursorcompositions andmethodsforformingnanoporoussilicadielectricfilmsby degradingorvaporizingoneormorecompoundsorpolymers presentintheprecursorcomposition.U.S.Pat.No.5,895.263 describesformingananoporoussilicadielectricfilmona Substrate,e.g.,awafer,byapplyingacompositioncompris ingdecomposablepolymerandorganicpolysilicai.e.,includ ingcondensedorpolymerizedsiliconpolymer,heatingthe compositiontofurthercondensethepolysilica,anddecom posingthedecomposablepolymertoformaporousdielectric layer. ProcessesforaplicationofprecursortoaSubstrate,aging, curing,planarization,andrenderingthefilm(s)hydrophobic aredescribed,forexample,inU.S.Pat.Nos.6,589,889and 6,037.275,amongothers.Substratesandwaferscontem platedhereinmaycompriseanydesirableSubstantialysolid material.Particularlydesirablesubstratelayerswouldcom prisefilms,glas,ceramic,plastic,metalorcoatedmetal,or compositematerial.Inpreferedembodiments,thesubstrate comprisesasiliconorgermaniumarsenidedieorwaferSur face,apackagingSurfaceSuchasfoundinacopper,silver, nickelorgoldplatedleadframe,acopperSurfaceSuchas foundinacircuitboardorpackageinterconecttrace,a via-walorstifenerinterface(“copper”includesconsider ationsofbarecopperandit’soxides),apolymer-basedpack agingorboardinterfaceSuchasfoundinapolyimide-based flexpackage,leadorothermetalaloysolderbalSurface, glasandpolymerssuchaspolyimide.The“substrate'may evenbedefinedasanotherpolymerchainwhenconsidering cohesiveinterfaces.Inmorepreferedembodiments,thesub stratecomprisesamaterialcommoninthepackagingand circuitboardindustriessuchassilicon,copper,glas,and anotherpolymer. comprisesthosesolventsthatareconsideredpartofthe hydrocarbonfamilyofsolvents.Hydrocarbonsolventsare thosesolventsthatcomprisecarbonandhydrogen.Itshould beunderstoodthatamajorityofhydrocarbonsolventsare non-polar;however,thereareafewhydrocarbonsolventsthat10 couldbeconsideredpolar.HydrocarbonSolventsaregener alybrokendownintothreclases:aliphatic,cyclicand aromatic.Aliphatichydrocarbonsolventsmaycompriseboth straight-chaincompoundsandcompoundsthatarebranched andpossiblycroslinked,however,aliphatichydrocarbon15 Solventsarenotconsideredcyclic.CyclichydrocarbonSol ventsarethosesolventsthatcompriseatleastthrecarbon atomsorientedinaringstructurewithpropertiessimilarto aliphatichydrocarbonSolvents.AromatichydrocarbonSol ventsarethosesolventsthatcomprisegenerallythreormore unsaturatedbondswithasingleringormultiplerings attachedbyacommonbondand/ormultipleringsfused together.Contemplatedhydrocarbonsolventsincludetolu ene,Xylene,p-Xylene,m-Xylene,mesitylene,Solventnaphtha H.SolventnaphthaA,alkanes,suchaspentane,hexane,iso25 hexane,heptane,nonane,octane,dodecane,2-methylbutane, hexadecane,tridecane,pentadecane,cyclopentane,2,2,4-tri methylpentane,petroleumethers,halogenatedhydrocarbons, Suchaschlorinatedhydrocarbons,nitratedhydrocarbons, benzene, 1,2-dimethylbenzene, 1,2,4-trimethylbenzene,30 mineralspirits,kerosene,isobutylbenzene,methylnaphtha lene,ethyltoluene,ligroine.Particularlycontemplatedsol ventsinclude,butarenotlimitedto,pentane,hexane,hep tane,cyclohexane,benzene,toluene,Xyleneandmixturesor combinationsthereof. 35 Inothercontemplatedembodiments,thesolventorsolvent mixturemaycomprisethosesolventsthatarenotconsidered partofthehydrocarbonsolventfamilyofcompounds,suchas ketones,suchasacetone,3-pentanone,diethylketone,methyl ethylketoneandthelike,alcohols,ketones,esters,ethersand40 amines.Inyetothercontemplatedembodiments,thesolvent Subsequentsemiconductormanufacturingprocessessuch Itisstilfurthercontemplatedthatalternativelowdielectric constantmaterialmayalsocompriseaditionalcomponents. Forexample,wherethelowdielectricconstantmaterialis exposedtomechanicalstres,softenersorotherprotective50 agentsmaybeadded.Inothercaseswherethedielectric materialisplacedonaSmoothSurface,adhesionpromoters mayadvantageouslyemployed.Instilothercases,theaddi tionofdetergentsorantifoamagentsmaybedesirable.In general,aprecursorintheformofe.g.,aspin-on-glascom 55 jectedtoanannealingtreatment,metalshrinkageinducesa positionthatincludesoneormoreremovablesolvents,is appliedtoasubstrate,andthenpolymerizedandSubjectedto solventremovalinsuchawayastoformadielectricfilm comprisingnanometer-scalepores. WhenformingSuchnanoporousfilms,e.g.,whereinthe60 precursorisappliedtoaSubstratebyspin-coating,thefilm coatingistypicalycatalyzedwithanacidorbasecatalystand watertocausepolymerization/gelation(“aging)duringan initialheatingstep.Thefilmisthencured,e.g.,bySubjecting thefilmtooneormorehighertemperatureheatingstepsto,65 interalia,removeanyremainingsolventandcompletethe polymerizationproces,asneeded.Othercuringmethods stressontheviaandtrenchwallsandcauseundesirableVoids toforminsidethedielectricmaterialbetweentheviasand trenches.Whenthefilmisanorganosilicatedielectricfilm,it hasoftenbeenhasbeenpreviouslysubjectedtoatleastone damagingtreatmentwhichremovesatleastaportionofpre viouslyexistingcarboncontainingmoietiesfromtheorgano silicatedielectricfilm.Suchfilmdamagecanresultfromsuch treatmentsaschemicalexposure,plasmaexposure,thermal treatment,Vacuumtreatment,ionizingradiationexposure, electronbeamexposure,UVexposure,etching,ashing,wet cleaning,plasmaenhancedchemicalvapordeposition,Super criticalfluidexposureandcombinationsthereof.Thesetreat

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