DOE Solar Energy Technologies Program

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DOE Solar Energy Technologies Program ( doe-solar-energy-technologies-program )

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Develop, construct and test an automated RCPCD minority-carrier lifetime mapping system (one- or two-dimensional) that incorporates auto-tuning and is capable of accepting samples up to 6” in diameter: Polycrystalline wafers and ribbons avoid the high cost of growing single crystal ingots, but non- uniformity and grain boundaries can degrade solar cell performance. Measuring the minority-carrier lifetime with spatial resolution across polycrystalline silicon can provide information toward understanding how detrimental these regions are. One of the reasons for the high cost of the commercially available microwave reflection lifetime measurement system described above is its scanning capability. Our goal was to develop a less costly scanning system with approximately the same spatial resolution of about 1 mm using the RCPCD system described above. We have designed and built a one-dimensional scanning system capable of measuring the lifetime of crystalline and multicrystalline silicon. This system (Fig. 5) is capable of rapidly analyzing heterogeneities in as-grown and processed material. The mapping capability will prove very useful in tracking and understanding the non- uniformities that are known to exist in multicrystalline silicon. Fig. 5. Lifetime Mapping System 3.4 Surface Analysis Complete experiments that correlate surface chemistry to the adhesion of polymer encapsulant and edge-seal materials used in module packaging designs. Investigate adhesion properties under both normal and damp heat conditions, with goal to facilitate 25-year module warranties: Photovoltaic R&D Fundamental Research Flexible polymer backsheet materials are being investigated as possible replacements for glass in double-glass thin-film module designs. The permeable nature of polymers, however, makes them unsuitable for long-term encapsulation. One possible solution is to deposit a thin moisture barrier on the polymer backsheet surface. The barrier efficacy is measured by its ability to impede moisture and by its adhesion to the polymer and the encapsulant. This project is jointly conducted with members of NREL’s Module Reliability team, who are investigating the use of silicon oxynitride layers on polyethylene terphthalate for such applications. The barrier films were deposited by plasma-enhanced chemical vapor deposition (PECVD) onto DuPont ST504 PET. Initial barrier results were inconsistent, and X-ray photoelectron spectroscopy (XPS) analysis found that the DuPont product had two different sides (i.e., one had been treated with an acrylic formulation, and this had not been tracked prior to the barrier depositions). A second issue was that the surface of the PET was treated with a plasma pre-etch step in the PECVD system prior to barrier layer deposition. Although initial performance of the barriers was generally good, the films on plasma- pretreated PET delaminated during damp heat testing. XPS was able to determine that failures were occurring at the PET/barrier film interface. Further, high-resolution XPS analysis from plasma-pretreated PET surfaces showed significant changes to the polymer, specifically chain scissioning with the concomitant creation of new chemical functionalities in a thin surface layer (<100 Å). Several experiments were performed to understand the stability of the reaction products. Temperature-programmed XPS was performed in which a treated PET film was heated in-situ while the photoelectron spectra for C1s, O1s, and N1s were monitored. Loss of nitrogen (N is indicative of plasma pretreatment) began at 70°C, near the polymer glass transition, with gradual restoration of the C and O signals of pure PET as the temperature was increased to the lamination temperature of 150°C. In addition, a plasma- treated film that had been water washed and transferred through inert atmosphere into the XPS also showed disappearance of the altered layer. Damp heat testing is performed at 85°C and 85% relative humidity (85/85). Our results yield a plausible explanation for loss of adhesion during damp heat testing; unstable reaction products at the PET surface create a weak interfacial layer that is affected by both temperature and humidity. Recent XPS depth profiles indicate that barrier film composition and thickness require better 10

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