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Figure 6.39. – FE-SEM Image of the ALD deposit of GF@CeO2. X-ray diffraction pattern of GF, GF@CeO2 and GF@CeO2:H electrodes are given in Figure 6.40. The broad peak near 2θ = 25 and 430 in the spectrum of GF-P electrode is attributed to the crystallographic planes of (002) and (004) of the original GF electrode. Additionally, diffraction peaks appeared in the pattern of GF@CeO2 electrode at 28.50; 33.00, 47.50 and 56.3o (Figure 6.40); which are consistent with the Ceria (CeO2) (111), (200), (220) and (311) crystalline planes, respectively. All peaks are in line with the standard pattern (JCPDS no.: 01-081-0792). After the treatment under reductive conditions, the obtained GF@CeO2-x displayed different XRD patterns at 26.3o, 43.9o and 55.7o, indicating that a phase transition to CeO2-x occurred in the reduction process. In spite the fact that the most intense peak is hindered under the broad peak related to GF, it can be observed on the two subsequently peaks on a low intensity marked by an asterisk. It also can be observed peaks related to CeO2, which implies a partial reduction of the ceria structure by and oxygen deficiency presence on the lattice structure. 134PDF Image | Redox Flow Batteries Vanadium to Earth Quinones
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