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Tribo-Charging during Powder in Selective Laser Sintering

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Tribo-Charging during Powder in Selective Laser Sintering ( tribo-charging-during-powder-selective-laser-sintering )

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Polymers 2019, 11, x FOR PEER REVIEW 4 of 13 Polymers 2019, 11, 609 4 of 12 glove box (SICCO Vitrum, Bohlender GmbH, Grünsfeld, Germany) to allow modifications in relative humidity or oxygen concentration of the ambient atmosphere. Due to the enhancement of (SICCO Vitrum, Bohlender GmbH, Grünsfeld, Germany) to allow modifications in relative humidity the conductivity, adsorption of water on the surface can alter the electric properties of polymer or oxygen concentration of the ambient atmosphere. Due to the enhancement of the conductivity, particles drastically [17]. Powder spreading is done by a doctor blade (Multicator 411, Erichsen adsorption of water on the surface can alter the electric properties of polymer particles drastically [17]. GmbH & Co. KG, Grünsfeld, Germany), which allows the stageless variation of gap height between Powder spreading is done by a doctor blade (Multicator 411, Erichsen GmbH & Co. KG, Grünsfeld, 1 μm and 1000 μm with an accuracy of 1 μm by a micrometer screw. Restrictions to the resulting Germany), which allows the stageless variation of gap height between 1 μm and 1000 μm with an powder layer thickness can apply according to the particle sizes of the used material. The deposition accuracy of 1 μm by a micrometer screw. Restrictions to the resulting powder layer thickness can speed can be varied between 0.1 mm/s and 100 mm/s, enabling the reproduction of typical coating apply according to the particle sizes of the used material. The deposition speed can be varied between speeds applied in SLS. The film applicator incorporates a heatable suction plate for fixation of the 0.1 mm/s and 100 mm/s, enabling the reproduction of typical coating speeds applied in SLS. The film grounded aluminum base plate on which the experiments are conducted. On the traverse of the applicator incorporates a heatable suction plate for fixation of the grounded aluminum base plate on applicator, an electrostatic voltmeter probe (model 1017AE, Monroe Electronics Inc., Lyndonville, which the experiments are conducted. On the traverse of the applicator, an electrostatic voltmeter NY, USA) is mounted. The probe is connected to an electrostatic voltmeter (ISOPROBE model 244A, probe (model 1017AE, Monroe Electronics Inc., Lyndonville, NY, USA) is mounted. The probe is Monroe Electronics Inc., Lyndonville, NY, USA) to measure the surface potential of the applied connected to an electrostatic voltmeter (ISOPROBE model 244A, Monroe Electronics Inc., Lyndonville, powder layer in a range between ±3000 V. Research has shown that surface potentials measured via NY, USA) to measure the surface potential of the applied powder layer in a range between ±3000 V. voltmeter correlate well with the surface charge density of polymer samples examined in suitable Research has shown that surface potentials measured via voltmeter correlate well with the surface Faraday-cup arrangements [28], thus enabling charge quantification. The relationship between charge density of polymer samples examined in suitable Faraday-cup arrangements [28], thus enabling potential difference Δφ and surface charge density σE is given by Equation (1): charge quantification. The relationship between potential difference ∆φ and surface charge density σE is given by Equation (1): ∆𝜑 = 𝜎􏴞 ∙ 𝐷 (1) σ ·D 𝜀E ∙ 𝜀 ∆φ= 􏱚 􏲋 (1) ε0·εr where, D is the layer thickness of the dielectric and εr and ε0 are the relative and the vacuum where, D is the layer thickness of the dielectric and εr and ε0 are the relative and the vacuum permittivity, permittivity, respectively. Equation (1) is valid for a solid material film and does not consider the respectively. Equation (1) is valid for a solid material film and does not consider the spherical character spherical character of the particulate bulk material. Since charges are generated at the layer surface of the particulate bulk material. Since charges are generated at the layer surface and in the bulk material and in the bulk material by different mechanisms their exact location is not known and therefore it is by different mechanisms their exact location is not known and therefore it is not possible to make not possible to make assumptions about the charge distribution along the powder layer height based assumptions about the charge distribution along the powder layer height based on the measured data. (a) (b) Figure 1..(a(a))ScShcehmemataictidcepdiecptiocntionf thoef mthoedeml opdoweldperowspdreardsinpgresaedtuinpgwsiethtutpheweliethctrtohsetateilcevctorlotmstaetiecr vforltmeatesrurfionrgmapeaoswudrienrg’sasuprfoawcedpero’tsenstuiarfladcuerpinogtepnotwialdedrusrpinregadpionwg.d(ebr)Sspchreamdaintigc.fu(bn)ctSiocnhaelmityatoicf ftuhnecqti/odn-amlietyteor.f the q/d-meter. on the measured data. The response time of the used voltmeter device is less than three milliseconds and therefore The response time of the used voltmeter device is less than three milliseconds and therefore enables measurements at high powder spreading speeds. However, the speed is limited by the enables measurements at high powder spreading speeds. However, the speed is limited by the sampling rate of data recording, which is done at a frequency of 5 Hz via LabVIEW (National sampling rate of data recording, which is done at a frequency of 5 Hz via LabVIEW (National Instruments, Austin, TX, USA). Instruments have been calibrated prior to the experiment to exhibit Instruments, Austin, TX, USA). Instruments have been calibrated prior to the experiment to exhibit no potential difference between the probe and the grounded base plate. Due to the proximity to the no potential difference between the probe and the grounded base plate. Due to the proximity to the doctor blading fixture, the measurement of the electrostatic surface potential occurs approximately four doctor blading fixture, the measurement of the electrostatic surface potential occurs approximately centimeters behind the layer formation, lowering the potential influence of charge relaxation processes. four centimeters behind the layer formation, lowering the potential influence of charge relaxation Depending on the probe to surface spacing, the measured signal is a mean value representative processes. Depending on the probe to surface spacing, the measured signal is a mean value

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