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2 Experimental methods 2.1 X-ray Diffraction Until the Ro ̈ntgen’s discovery of X-rays in 1895, the diffraction phenomena was mainly implemented in diffraction gratings or focusing optics for the light in the visible range. It was first discovered in 1912 by Max von Laue that X-rays can be diffracted on crystals and that it is possible to obtain information from structures smaller than one nanometer. Therefore, thanks to the small wavelength of X-ray radiation (ranging from 0.1 nm to 10 nm) it became possible to ’see’ the details of the structure of a matter. Nowadays, the X-ray diffraction method is one of the most basic, standard and popular methods to characterize and investigate materials structure. The X-ray diffraction (XRD) is a technique that allows determination of the interior structure of many materials, including thin films. It is based on phenom- ena of elastic scattering of X-rays by electron clouds surrounding atoms in a given material. When this scattering (also called Thomson scattering) occurs in the pe- riodic lattice of atoms, the interference results in the formation of the diffraction pattern. X-ray diffraction is ruled by a few equations which are fundamental for the technique and proper description of the investigated crystal structure. Thus, the X-rays irradiating any material will be scattered by atoms (or electrons sur- rounding atoms) in analogy to how visible radiation is scattered when passing through a slit. The beams incident on the material’s surface under angle θ are scattered within the same plane and under the same angle to the surface, pre- serving the law of reflection. The diffracted beams interfere constructively only if they are in phase, i.e. if the path difference between beams is a multiple of the 35PDF Image | Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films
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