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2.2 X-ray Fluorescence Spectroscopy The coefficient is a weighted sum of mass attenuation coefficients of all el- ements present in a sample. However, the coefficient depends on the energy of radiation. This results in varying sensitivity of detection of elements. Figure 2.5: Energy dependence of the mass absorption coefficient μ for several elements - Show elements such as Sm, Eu, Ni, O, Cr, and photon energy of rhodium radiation. Adapted from (31), p.368. The intensity of the fluorescent X-ray radiation is proportional to the con- centration of an element in a sample. Typically, in order to correctly assess the concentration of elements in the unknown sample, it is necessary to use a calibra- tion curve. The curve is a relation between intensity fluorescent radiation and the elemental concentration and is obtained for known standards. Nowadays, theoret- ical intensities can be also obtained, and reliable XRF analysis can be performed without measuring any additional standards. However, one has to remember that proper sample preparation is becoming critical for obtaining good results of the sample composition. Typically sample should be ground finely without any selective losses of chemical elements and the powder should be mixed thoroughly to obtain a homogeneous mixture. On the other hand, thin film materials cannot be ground and mixed. This is an advantage and disadvantage at the same time. Despite the fact that the sample cannot be made homogenous, high energy X-rays can penetrate into the bulk (depending on the energy). What is more, knowing the composition of the material, one can calculate the decrease in the radiation intensity due to the absorption of the material. The XRF measurements in this work were performed with the use of ZSX Primus II from Rigaku equipped with 4 kW X-ray tube with Rh anode. This 41PDF Image | Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films
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