Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films

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Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films ( investigation-metal-insulator-transition-magnetron-sputtered )

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Figure 3.24: AFM image of surface topography of S-30AOn film, 500×500 nm2 scan. - Surface of the film before annealing, the grains have about 40-50 nm in diameter, surface is smooth with low roughness. Image obtained in contact mode. 3.3 Structural characterization Figure 3.25: AFM image of surface topography of S-36AOw film. - Image obtained in contact mode. 85

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Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films

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