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Figure 3.24: AFM image of surface topography of S-30AOn film, 500×500 nm2 scan. - Surface of the film before annealing, the grains have about 40-50 nm in diameter, surface is smooth with low roughness. Image obtained in contact mode. 3.3 Structural characterization Figure 3.25: AFM image of surface topography of S-36AOw film. - Image obtained in contact mode. 85PDF Image | Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films
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Sulfur Deposition on Carbon Nanofibers using Supercritical CO2 Sulfur Deposition on Carbon Nanofibers using Supercritical CO2. Gamma sulfur also known as mother of pearl sulfur and nacreous sulfur... More Info
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