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4.1 Local conductivity of SmNiO3 thin films Figure 4.2: Average current as a function of temperature in sample be- fore and after annealing - Data was taken for samples S-30AO deposited for 30 minutes in argon-oxygen atmosphere. Data collected for measured current maps show quite a large scatter, however a mildly increasing trend is evidenced. For ev- ery temperature the value of current was averaged and the points are marked in orange colour with standard deviation errors. a. Data for as-deposited film, bias voltage 2.5 V. Current is at the level of few pA. b. Data for the same sample but after annealing procedure, bias voltage 0.1 V. Current at the level of a few nA. Sample S-30AOn after being annealed presents much better electrical proper- ties - that is conductance of S-30AOw is a few orders of magnitude higher than before annealing (for sample S-30AOn). The result is even more surprising be- cause bias voltage in measurements of as-deposited sample was 2.5 V, and after annealing bias voltage of 0.1 V was found to be sufficient and the most appropri- ate. Each of the image was scanned with the voltage and several maps of local current were collected for a certain temperature. For each current map the current value of each measurement point was averaged over whole image. The resulting average values of current were depicted versus temperature in figure 4.2 b. The first noticeable feature is a large scatter of data. There are two main causes for that, which are as an example depicted in figure 4.3 for sample S-36AOw. For one thing, the surface of the sample, although in vacuum, carries various impurities which often build up on the surface of the scan- ning tip. Such impurity when present between the scanning tip and the surface impedes a proper flow of electrical current. The images of current distribution show that there often appear broad horizontal stripes of image where the current is lower or higher, without associated change in the surface morphology. Unfor- tunately it is quite difficult to remove such impurities, the most effective method 91PDF Image | Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films
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