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4.1 Local conductivity of SmNiO3 thin films Figure 4.6: Average current and resistance as a function of temperature in sample S-36AOw. - a. Values of current averaged over scan area. The square orange points show a mean value of current for each temperature, together with standard deviation error. b. Mean averaged current converted to resistance with respect to Ohm’s law. The bias voltage is 0.1 V. in the poorly-conducting areas the current is rather stable. However the data scatter is very high. On top of that there appear to be two critical temperatures at which the electric current is erratic - at about 354 K and 413 K. This sample might be too thin, and the observed effects are in great deal masked by the effects of surface contamination. On top of that the sample exhibited resistive switching behaviour as well. The resistance was calculated to be of the order tens of GΩ. At that point it is clear that surface contact methods do not give the possibil- ity to properly investigate the properties of magnetron sputtered SmNiO3 films. The main reason is surface contamination that was deposited on surface during necessary annealing procedure. It was presumed that for each annealed film, the material underlaying the surface layer of contamination is the proper SmNiO3 phase that possesses the interesting properties such as metal-insulator transition. That argument was verified during investigation of sample S-24AOw, where ’bare’ areas of sub-surface layer of material appeared together with normal sample surface. Example of surface topography where those two regions are present are shown in figure 4.10. Images depict surface morphology and topography of surface area (marked in blue rectangle) as well as sub-surface area (marked in green rectangle). It was found that in sub-surface areas of sample the current was higher by about two orders of magnitude than in surface areas. The temperature variation of local conductivity is best visualized in the I-V 95PDF Image | Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films
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