Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films

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Investigation of metal-insulator transition in magnetron sputtered samarium nickelate thin films ( investigation-metal-insulator-transition-magnetron-sputtered )

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4.3 Nickel electronic structure across the MIT Figure 4.16: Temperature dependence of Raman spectra in sample S- 30AOn - Raman spectra at chosen temperatures do not show any bands of the main massif between 400 and 500 cm−1, and their shape is an indication of amorphous character of the sample. Raman spectra at specific temperatures are given together with the fittings. For clarity, the high intensity first and second silicon bands have been cut out. of investigated films, in XPS the irradiating X-ray beam penetrates the sample deeper than only the strict surface and the escape depth of analyzed photoelec- trons is at least few nanometers. Also gentle surface mechanical modification allowed to measure and to obtain interesting temperature dependent results. The elemental composition of SNO films as well as the type of contaminations and their chemical states is described in previous chapter. This section is entirely focused on the chemical state of elements building SmNiO3 films, primarily nickel, and their temperature dependence. According to various theories on metal-insulator transition in compounds such as samarium nickelate, the nickel ion plays a crucial role in the phenomena. A possible disproportionation between charge on the nickel site in the temperature 107

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